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Nanometrics Inc NANO.OQ (NASDAQ Stock Exchange Global Select Market)

37.37 USD
-0.25 (-0.66%)
As of Jul 20
chart
Previous Close 37.62
Open 37.48
Volume 40,051
3m Avg Volume 112,211
Today’s High 37.58
Today’s Low 37.27
52 Week High 44.13
52 Week Low 22.49
Shares Outstanding (mil) 25.50
Market Capitalization (mil) 721.01
Forward P/E 15.07
Dividend (Yield %) -- ( -- )

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RECOMMENDATION

Sell Hold Buy
2.00 Mean rating from 4 analysts

KEY STATS

Revenue (mm, USD)
FY18
82
FY17
259
FY16
221
FY15
187
EPS (USD)
FY18
0.669
FY17
1.279
FY16
1.733
FY15
0.119
*Note: Units in Millions of U.S. Dollars
**Note: Units in U.S. Dollars

KEY RATIOS

Price to Earnings (TTM)
vs sector
15.07
1,251.45
Price to Sales (TTM)
vs sector
2.98
2.87
Price to Book (MRQ)
vs sector
2.72
2.28
Price to Cash Flow (TTM)
vs sector
12.93
15.64
Total Debt to Equity (MRQ)
vs sector
0.00
16.66
LT Debt to Equity (MRQ)
vs sector
0.00
8.90
Return on Investment (TTM)
vs sector
20.34
13.72
Return on Equity (TTM)
vs sector
20.54
13.63

EXECUTIVE LEADERSHIP

Bruce Rhine
Independent Chairman of the Board, Since 2011
Salary: $19,231.00
Bonus: --
Pierre-Yves Lesaicherre
President, Chief Executive Officer, Director, Since 2017
Salary: --
Bonus: --
Greg Swyt
Principal Financial Officer and Accounting Officer, Since 2018
Salary: --
Bonus: --
James Barnhart
Senior Vice President - Operations, Since 2018
Salary: --
Bonus: --
Kevin Heidrich
Senior Vice President, Strategic Marketing and Business Development, Since 2006
Salary: --
Bonus: --

COMPANY PROFILE

Sector: Technology
Industry: Semiconductor Equipment & Testing
Address:

1550 Buckeye Dr
MILPITAS   CA   95035-7418

Phone: +1408.4359600

Nanometrics Incorporated is a provider of process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness (HB) light emitting diodes (LEDs), discretes and data storages components. The Company's automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The Company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to production of semiconductors and other devices, to three-dimensional wafer-level packaging applications. The Company's automated systems primarily consist of automated metrology systems that are employed in semiconductor production environments.

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